Checkpoint Charlie © Diane Meyer
Diane Meyer, an alum of the NYU Tisch Department of Photography & Imaging, has a solo exhibition BERLIN at NYC's Klompching Gallery, coinciding with the 30th anniversary of the fall of the Berlin wall. The show is on view from November 19, 2019 through January 25, 2020.
From the gallery's website:
"Made over the course of seven years, the photographs trace the entire, circa 96 mile path of the former Berlin Wall, taking in sites in the German capital’s city center, as well as the outskirts of the city through suburbs and the surrounding countryside.
Sections of the photographs have been obscured by cross-stitch embroidery, sewn directly into the photograph. This stitching is a signature mark of the artist across her artworks. The embroidery is made to resemble pixels and borrows the visual language of digital imaging in an analog, tactile process. In many images, the embroidered sections represent the exact scale and location of the former Wall offering a pixelated view of what lies behind. In this way, the embroidery appears as a translucent trace in the landscape of something that no longer exists but is a weight on history and memory."